Коллеги, добрый день. SSD самсунг, 2 год. Иногда при высоком IO начал наблюдать 12309.
Помогите прочитать smart, сколько ему жить осталось и стоит ли уже менять?
[fjfalcon@laptop ~]$ sudo smartctl -a /dev/sda
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.5-1-ARCH] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZ7PC128HAFU-000
Serial Number: S0YGNYABC70446
LU WWN Device Id: 5 002538 043584d30
Firmware Version: CXM02K1Q
User Capacity: 128 035 676 160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Mar 5 14:50:20 2014 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 6505
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 2126
177 Wear_Leveling_Count 0x0013 088 088 000 Pre-fail Always - 404
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 062 037 000 Old_age Always - 38
195 Hardware_ECC_Recovered 0x001a 200 200 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
235 Unknown_Attribute 0x0012 099 099 000 Old_age Always - 929
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 8168352832
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Спасибо за помощь.
