История изменений
Исправление n0mad, (текущая версия) :
На тему HDD Regenerator.
Началось с винта с zfs. Появились бэды. Пытался справиться badblocks - не помогло. Качнул ISO с HDD Regenerator, загрузился, протестил! 18 бэдов (badblocks их видел как 9)
Указав тот район - прогнал HDD Regenerator, за 5 минут бэды вылечились. Но мне этого показалось мало. Решил запустить принудительную регенерацию ВСЕГО винта. Длилось это 118 часов!
Нашло 17441 delays, я надеялся оно их вылечило, но увы. Запустил повторно, на 0.50% поверхности нашло так же 90 delays как и в первый раз.
Ну ладно...
Загрузился, запустил gdisk, тот исправил убитую GPT и я спокойно импортировал zfs. уже на рабочей системе запустил -t long
Работало 10.5 часов.
Результат:
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" DT01ACA... Desktop HDD
Device Model: TOSHIBA DT01ACA300
Serial Number: Z7P6GLWAS
LU WWN Device Id: 5 000039 fe6df2013
Firmware Version: MX6OABB0
User Capacity: 3 000 592 982 016 bytes [3,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5319
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Nov 7 22:58:41 2025 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (21217) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 354) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 67
3 Spin_Up_Time 0x0007 140 140 024 Pre-fail Always - 372 (Average 444)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 358
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 124 124 020 Pre-fail Offline - 33
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 40069
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 346
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 520
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 520
194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Min/Max 15/55)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 7
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 2888
SMART Error Log Version: 1
ATA Error Count: 3340 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3340 occurred at disk power-on lifetime: 39936 hours (1664 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 87 e5 d2 07 Error: UNC 1 sectors at LBA = 0x07d2e587 = 131261831
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 01 87 e5 d2 e0 00 5d+09:56:45.022 READ DMA EXT
35 20 01 86 e5 d2 e0 00 5d+09:56:45.022 WRITE DMA EXT
25 20 01 86 e5 d2 e0 00 5d+09:56:45.022 READ DMA EXT
25 20 01 87 e5 d2 e0 00 5d+09:56:44.744 READ DMA EXT
25 20 01 86 e5 d2 e0 00 5d+09:56:44.744 READ DMA EXT
////// УДАЛЕНО ////// УДАЛЕНО ////// УДАЛЕНО //////
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 40068 -
# 2 Extended offline Completed: read failure 40% 39858 3352487288
# 3 Extended offline Completed: read failure 40% 39752 3352487288
# 4 Extended offline Completed: read failure 50% 39721 2750853704
# 5 Extended offline Completed without error 00% 31577 -
3 of 3 failed self-tests are outdated by newer successful extended offline self-test # 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 2750853704 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Оставил только последнюю ошибку, иначе «сообщение слишком большое». Эта ошибка была до HDD Regenerator. Сейчас всё прошло без ошибок!
И самое главное, не появились Reallocated Sectors, появились только какие то Reallocated Event.
Исходная версия n0mad, :
На тему HDD Regenerator.
Началось с винта с zfs. Появились бэды. Пытался справиться badblocks - не помогло. Качнул ISO с HDD Regenerator, загрузился, протестил! 18 бэдов (badblocks их видел как 9)
Указав тот район - прогнал HDD Regenerator, за 5 минут бэды вылечились. Но мне этого показалось мало. Решил запустить принудительную регенерацию ВСЕГО винта. Длилось это 118 часов!
Нашло 17441 delays, я надеялся оно их вылечило, но увы. Запустил повторно, на 0.50% поверхности нашло так же 90 delays как и в первый раз.
Ну ладно...
Загрузился, запустил gdisk, тот исправил убитую GPT и я спокойно импортировал zfs. уже на рабочей системе запустил -t long
Работало 10.5 часов.
Результат:
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" DT01ACA... Desktop HDD
Device Model: TOSHIBA DT01ACA300
Serial Number: Z7P6GLWAS
LU WWN Device Id: 5 000039 fe6df2013
Firmware Version: MX6OABB0
User Capacity: 3 000 592 982 016 bytes [3,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 3.5 inches
Device is: In smartctl database 7.3/5319
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Fri Nov 7 22:58:41 2025 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x85) Offline data collection activity
was aborted by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (21217) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 354) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 140 140 054 Pre-fail Offline - 67
3 Spin_Up_Time 0x0007 140 140 024 Pre-fail Always - 372 (Average 444)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 358
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 124 124 020 Pre-fail Offline - 33
9 Power_On_Hours 0x0012 095 095 000 Old_age Always - 40069
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 346
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 520
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 520
194 Temperature_Celsius 0x0002 150 150 000 Old_age Always - 40 (Min/Max 15/55)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 7
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 2888
SMART Error Log Version: 1
ATA Error Count: 3340 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3340 occurred at disk power-on lifetime: 39936 hours (1664 days + 0 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 01 87 e5 d2 07 Error: UNC 1 sectors at LBA = 0x07d2e587 = 131261831
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 20 01 87 e5 d2 e0 00 5d+09:56:45.022 READ DMA EXT
35 20 01 86 e5 d2 e0 00 5d+09:56:45.022 WRITE DMA EXT
25 20 01 86 e5 d2 e0 00 5d+09:56:45.022 READ DMA EXT
25 20 01 87 e5 d2 e0 00 5d+09:56:44.744 READ DMA EXT
25 20 01 86 e5 d2 e0 00 5d+09:56:44.744 READ DMA EXT
////// УДАЛЕНО ////// УДАЛЕНО ////// УДАЛЕНО //////
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 40068 -
# 2 Extended offline Completed: read failure 40% 39858 3352487288
# 3 Extended offline Completed: read failure 40% 39752 3352487288
# 4 Extended offline Completed: read failure 50% 39721 2750853704
# 5 Extended offline Completed without error 00% 31577 -
3 of 3 failed self-tests are outdated by newer successful extended offline self-test # 1
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 2750853704 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Оставил только последнюю ошибку, иначе «сообщение слишком большое».
И самое главное, не появились Reallocated Sectors, появились только какие то Reallocated Event.